The instruments of SURFACE
IMAGING SYSTEMS are known for
their capability of high resolution imaging of surface topography. The
unmatched performance reaches down to an atomic resolution level and
provides quantitative data of surface structures. Besides the direct
approach of measuring topographic structures, our systems are able to
deliver a lot more of information on materials properties. All of our
instruments can be equipped with the most important scanning modes. The
standard version comes with contact mode capabilities. All other modes
can be added optionally at the time of purchase or later as an upgrade.
The list of available modes includes:
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Non - contact, intermittent, and
close - contact mode,
including phase contrast
