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The optimised surface inspection system
The
NANOStation®
II
combines optical microscopy and Scanning Probe Microscopy in a single,
optimized set - up. The combination of the S.I.S. ULTRAObjective®
AFM / SPM and
a high power optical microscope on a highly rigid granite stand makes
the NANOStation®
II
a highly effective and exceptionally versatile inspection system. |
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Due to its proprietary, sturdy design, the SPM performance reaches down
to an atomic resolution level. Using a strong, yet extremely precise
vertical motion stage allows to measure even on very heavy and large
samples. The NANOStation®
II
can be easily adapted to special requirements and customers wishes:
from manually positioning to high precision joystick automatization,
from liquid cell observation on biological tissue to the industrialized
inspection in quality control. All AFM/SPM
modes and optical contrast techniques are available, making the
NANOStation®
II
the ideal inspection
tool where the ultimate performance is required. |
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