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SURFACE
IMAGING SYSTEMS
(S.I.S.) is a manufacturer of
high quality, most versatile Scanning
Probe Microscopy (SPM) components. With an experienced scientific staff
we turn the latest SPM techniques into novel products for surface
characterization. |
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Our vision is to provide our customers with complete solutions for
identifying and quantifying small surface structures - from an
easy - to - use SPM in combination
with a light
microscope to a highly specialized inspection system. SIS' instruments
are used in a broad range of industrial and research applications
including materials science, microelectronics, semiconductor
processing, storage technology, biology, etc. We believe that working
closely with our customers and strategic partners promotes progress,
creates new applications, maximizes cost efficiency in using SPM
technology, and reduces time to develop new products. |
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Founded in 1993, SIS has soon become the leading manufacturer of SPM
components and adaptions for a number of different surface inspection
methods. We maintain this position through numerous
cooperations
with research institutions through out the SPM community. This
enables us to provide a continuous advancement of the
technology
for the benefit of our customers.
SURFACE IMAGING SYSTEMS
(S.I.S.)
Rastersonden- und Sensormesstechnik GmbH
Kaiserstrasse 100 (Technologiepark Herzogenrath, TPH)
D-52134 Herzogenrath, Germany
Phone: + 49 (0) 24 07 - 56 42 0
Fax : + 49 (0) 24 07 - 56 42 100
info@sis-gmbh.com
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